DocumentCode
1953016
Title
Cost-effective approach in LDMOS with partial 0.35μm design into conventional 0.6μm process
Author
Kubota, Toshiro ; Watanabe, Kiminori ; Karouji, Kumiko ; Ueno, Mitsuru ; Anai, Yasuko ; Kawaguchi, Yusuke ; Nakagawa, Akio
Author_Institution
Syst. LSI Div., Toshiba Corp. Semicond. Co., Kitakyushu, Japan
fYear
2003
fDate
14-17 April 2003
Firstpage
245
Lastpage
248
Abstract
We propose a practical solution, which can provide the same high performance LDMOS as that of the more advanced CMOS design rule with retaining still the low cost of the old technology. More specifically, we have introduced a limited number of 0.35μm equivalent mask alignment steps into 0.6μm based BCD processes. We have successfully developed 0.6μm design based 40V and 50V LDMOS, whose on-resistances are superior to those of 0.35μm based LDMOS. The on-resistance of the developed 40V and 50V LDMOS are 54.3 and 69.7 mΩ mm2, respectively. These values are superior to the reported values of the 0.35μm design LDMOS.
Keywords
CMOS integrated circuits; electric resistance; integrated circuit design; integrated circuit economics; masks; power MOSFET; power integrated circuits; 0.35 micron; 0.6 micron; 40 V; 50 V; BCD process; cost-effective approach; high performance LDMOS; mask alignment step; CMOS logic circuits; CMOS process; CMOS technology; Costs; Laboratories; Large scale integration; Lithography; Logic design; Power dissipation; Process design;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Semiconductor Devices and ICs, 2003. Proceedings. ISPSD '03. 2003 IEEE 15th International Symposium on
Print_ISBN
0-7803-7876-8
Type
conf
DOI
10.1109/ISPSD.2003.1225274
Filename
1225274
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