• DocumentCode
    1953016
  • Title

    Cost-effective approach in LDMOS with partial 0.35μm design into conventional 0.6μm process

  • Author

    Kubota, Toshiro ; Watanabe, Kiminori ; Karouji, Kumiko ; Ueno, Mitsuru ; Anai, Yasuko ; Kawaguchi, Yusuke ; Nakagawa, Akio

  • Author_Institution
    Syst. LSI Div., Toshiba Corp. Semicond. Co., Kitakyushu, Japan
  • fYear
    2003
  • fDate
    14-17 April 2003
  • Firstpage
    245
  • Lastpage
    248
  • Abstract
    We propose a practical solution, which can provide the same high performance LDMOS as that of the more advanced CMOS design rule with retaining still the low cost of the old technology. More specifically, we have introduced a limited number of 0.35μm equivalent mask alignment steps into 0.6μm based BCD processes. We have successfully developed 0.6μm design based 40V and 50V LDMOS, whose on-resistances are superior to those of 0.35μm based LDMOS. The on-resistance of the developed 40V and 50V LDMOS are 54.3 and 69.7 mΩ mm2, respectively. These values are superior to the reported values of the 0.35μm design LDMOS.
  • Keywords
    CMOS integrated circuits; electric resistance; integrated circuit design; integrated circuit economics; masks; power MOSFET; power integrated circuits; 0.35 micron; 0.6 micron; 40 V; 50 V; BCD process; cost-effective approach; high performance LDMOS; mask alignment step; CMOS logic circuits; CMOS process; CMOS technology; Costs; Laboratories; Large scale integration; Lithography; Logic design; Power dissipation; Process design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs, 2003. Proceedings. ISPSD '03. 2003 IEEE 15th International Symposium on
  • Print_ISBN
    0-7803-7876-8
  • Type

    conf

  • DOI
    10.1109/ISPSD.2003.1225274
  • Filename
    1225274