• DocumentCode
    1953113
  • Title

    Thermo-mechanical evaluation and life time simulation of high power LED lamp boards

  • Author

    Jakovenko, J. ; Formánek, J. ; Pardo, B. ; Perpiñà, X. ; Werkhoven, R.J. ; Kunen, J.M.G. ; Bancken, P. ; Bolt, P.J.

  • Author_Institution
    Fac. or Electr. Eng., Czech Tech. Univ. in Prague, Prague, Czech Republic
  • fYear
    2012
  • fDate
    16-18 April 2012
  • Firstpage
    42374
  • Lastpage
    42495
  • Abstract
    This work deals with a precise 3-D modelling of several LED board technologies mainly focused on thermal, thermo-mechanical evaluation and life time prediction to compare their performances. Main role of each LED board is to transport heat from LED die to heat sink and keep the thermal stresses in all layers as low as possible. Thermal stress has been inspected for the widest temperature range that can affect the LED boards (-40 to +125°C). Additionally, thermal stress cycles that lead to the LED board failure due to thermal fatigue have been calculated. Simulations have been completed with ANSYS structural analysis where temperature dependent stress-strain material properties have been taken into account. The objective of the analysis is to optimize not only the thermal management by thermal simulation of LED boards, but also to find potential problems from mechanical fatigue point of view.
  • Keywords
    LED lamps; fatigue; heat sinks; numerical analysis; stress-strain relations; thermal management (packaging); ANSYS structural analysis; LED board failure; LED board technologies; heat sink; high power LED lamp boards; life time simulation; light emitting diode; mechanical fatigue; precise 3-D modelling; stress-strain material properties; thermal evaluation; thermal fatigue; thermal management; thermal simulation; thermal stress cycles; thermo-mechanical evaluation; Light emitting diodes; Lighting; Reliability engineering; Semiconductor device measurement; Thermal expansion; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2012 13th International Conference on
  • Conference_Location
    Cascais
  • Print_ISBN
    978-1-4673-1512-8
  • Type

    conf

  • DOI
    10.1109/ESimE.2012.6191760
  • Filename
    6191760