DocumentCode
1953113
Title
Thermo-mechanical evaluation and life time simulation of high power LED lamp boards
Author
Jakovenko, J. ; Formánek, J. ; Pardo, B. ; Perpiñà, X. ; Werkhoven, R.J. ; Kunen, J.M.G. ; Bancken, P. ; Bolt, P.J.
Author_Institution
Fac. or Electr. Eng., Czech Tech. Univ. in Prague, Prague, Czech Republic
fYear
2012
fDate
16-18 April 2012
Firstpage
42374
Lastpage
42495
Abstract
This work deals with a precise 3-D modelling of several LED board technologies mainly focused on thermal, thermo-mechanical evaluation and life time prediction to compare their performances. Main role of each LED board is to transport heat from LED die to heat sink and keep the thermal stresses in all layers as low as possible. Thermal stress has been inspected for the widest temperature range that can affect the LED boards (-40 to +125°C). Additionally, thermal stress cycles that lead to the LED board failure due to thermal fatigue have been calculated. Simulations have been completed with ANSYS structural analysis where temperature dependent stress-strain material properties have been taken into account. The objective of the analysis is to optimize not only the thermal management by thermal simulation of LED boards, but also to find potential problems from mechanical fatigue point of view.
Keywords
LED lamps; fatigue; heat sinks; numerical analysis; stress-strain relations; thermal management (packaging); ANSYS structural analysis; LED board failure; LED board technologies; heat sink; high power LED lamp boards; life time simulation; light emitting diode; mechanical fatigue; precise 3-D modelling; stress-strain material properties; thermal evaluation; thermal fatigue; thermal management; thermal simulation; thermal stress cycles; thermo-mechanical evaluation; Light emitting diodes; Lighting; Reliability engineering; Semiconductor device measurement; Thermal expansion; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2012 13th International Conference on
Conference_Location
Cascais
Print_ISBN
978-1-4673-1512-8
Type
conf
DOI
10.1109/ESimE.2012.6191760
Filename
6191760
Link To Document