• DocumentCode
    1953139
  • Title

    Bipolar technology for 0.5-micron-wide base transistor with an ECL gate delay of 21.5 picoseconds

  • Author

    Nakamura, S. ; Toyofuku, T. ; Sueda, M. ; Hasegawa, K. ; Kato, I. ; Takada, T.

  • Author_Institution
    Fujitsu Labs. Ltd., Kawasaki, Japan
  • fYear
    1992
  • fDate
    13-16 Dec. 1992
  • Firstpage
    445
  • Lastpage
    448
  • Abstract
    This paper presents a high speed Si bipolar transistor using polysilicon sidewall base-electrode transistor (POSET) technology developed from self-aligned silicon bipolar transistor technology. We reduced the parasitic capacitance between the base and the collector to a minimum to maximize the transistor´s speed. Other techniques were used to make a practical device with a gate delay time of 21.5 ps/gate at a switching current of 0.32 mA. This is faster than any commercial bipolar transistor at a switching current about one third.<>
  • Keywords
    bipolar integrated circuits; bipolar transistors; capacitance; delays; elemental semiconductors; emitter-coupled logic; integrated logic circuits; silicon; 0.32 mA; 0.5 micron; 21.5 ps; ECL gate delay; POSET technology; Si; high speed Si bipolar transistor; parasitic capacitance; polysilicon sidewall base-electrode transistor; submicron base width; switching current; Bipolar integrated circuits; Bipolar transistors; Capacitance; Delay effects; Emitter coupled logic; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1992. IEDM '92. Technical Digest., International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-0817-4
  • Type

    conf

  • DOI
    10.1109/IEDM.1992.307397
  • Filename
    307397