Title :
Bipolar technology for 0.5-micron-wide base transistor with an ECL gate delay of 21.5 picoseconds
Author :
Nakamura, S. ; Toyofuku, T. ; Sueda, M. ; Hasegawa, K. ; Kato, I. ; Takada, T.
Author_Institution :
Fujitsu Labs. Ltd., Kawasaki, Japan
Abstract :
This paper presents a high speed Si bipolar transistor using polysilicon sidewall base-electrode transistor (POSET) technology developed from self-aligned silicon bipolar transistor technology. We reduced the parasitic capacitance between the base and the collector to a minimum to maximize the transistor´s speed. Other techniques were used to make a practical device with a gate delay time of 21.5 ps/gate at a switching current of 0.32 mA. This is faster than any commercial bipolar transistor at a switching current about one third.<>
Keywords :
bipolar integrated circuits; bipolar transistors; capacitance; delays; elemental semiconductors; emitter-coupled logic; integrated logic circuits; silicon; 0.32 mA; 0.5 micron; 21.5 ps; ECL gate delay; POSET technology; Si; high speed Si bipolar transistor; parasitic capacitance; polysilicon sidewall base-electrode transistor; submicron base width; switching current; Bipolar integrated circuits; Bipolar transistors; Capacitance; Delay effects; Emitter coupled logic; Silicon;
Conference_Titel :
Electron Devices Meeting, 1992. IEDM '92. Technical Digest., International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-0817-4
DOI :
10.1109/IEDM.1992.307397