• DocumentCode
    1953140
  • Title

    Contribution to thick film interdigital capacitor characterization

  • Author

    Pulec, Jiri ; Szendiuch, Ivan

  • Author_Institution
    Dept. of Microelectron., Brno Univ. of Technol., Brno, Czech Republic
  • fYear
    2011
  • fDate
    11-15 May 2011
  • Firstpage
    50
  • Lastpage
    52
  • Abstract
    This article deals with characterization of thick film interdigital capacitors, where attention is devoted to the influence of air gap width on capacitance. Air gap serves as dielectric and the scope of interest is dependence of the capacitance on air gap width. The set of interdigital capacitors was created with different air gap width. These capacitors were measured and result is evaluated in this article.
  • Keywords
    thick film capacitors; air gap width; dielectric; thick film interdigital capacitor characterization; Capacitance; Capacitance measurement; Capacitors; Electric fields; Insulation; Seminars; Thick films;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Technology (ISSE), 2011 34th International Spring Seminar on
  • Conference_Location
    Tratanska Lomnica
  • ISSN
    2161-2528
  • Print_ISBN
    978-1-4577-2111-3
  • Type

    conf

  • DOI
    10.1109/ISSE.2011.6053548
  • Filename
    6053548
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1953140