• DocumentCode
    1953341
  • Title

    Implement TPS with ATML and NI TestStand

  • Author

    Shuyi, Fan ; Chen, Meng ; Huixia, Jiang

  • Author_Institution
    Ordnance Eng. Coll., Shijiazhuang, China
  • Volume
    7
  • fYear
    2010
  • fDate
    9-11 July 2010
  • Firstpage
    538
  • Lastpage
    541
  • Abstract
    The Automatic Test Markup Language (ATML) is a documentation standard for automatic test information. ATML was born out of the thought that it is “the information” and a way to “communicate that information” may be the way to improve upon the inefficiencies of testing in both time and budget. ATML defines a collection of IEEE Standards and XML schema that represent automatic test related information (such as test description, test results, UUT description and instrument description) which will provide increased ATE system compatibility and Test Program Set (TPS) transportability. The two most adopted XML schemas in the ATML standard are Test Description (TD) and Test Results. Many organizations are expecting the adoption of ATML TD standards to reduce the development and maintenance costs of TPS and expecting the adoption of Test Results to facilitate sharing the test outcomes up and down the maintenance chain of product. This paper discusses how to translate ATML TD to National Instruments (NI) TestStand TPS with ATML TD TestStand translator. Finally, a test report which conformance to ATML standards is generated.
  • Keywords
    XML; NI teststand; automatic test markup language; national instruments; test program set; Instruments; Three dimensional displays; Variable speed drives; XML; ATML; ATS; NI TestStand; Test Description;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Science and Information Technology (ICCSIT), 2010 3rd IEEE International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-5537-9
  • Type

    conf

  • DOI
    10.1109/ICCSIT.2010.5564805
  • Filename
    5564805