DocumentCode
1953341
Title
Implement TPS with ATML and NI TestStand
Author
Shuyi, Fan ; Chen, Meng ; Huixia, Jiang
Author_Institution
Ordnance Eng. Coll., Shijiazhuang, China
Volume
7
fYear
2010
fDate
9-11 July 2010
Firstpage
538
Lastpage
541
Abstract
The Automatic Test Markup Language (ATML) is a documentation standard for automatic test information. ATML was born out of the thought that it is “the information” and a way to “communicate that information” may be the way to improve upon the inefficiencies of testing in both time and budget. ATML defines a collection of IEEE Standards and XML schema that represent automatic test related information (such as test description, test results, UUT description and instrument description) which will provide increased ATE system compatibility and Test Program Set (TPS) transportability. The two most adopted XML schemas in the ATML standard are Test Description (TD) and Test Results. Many organizations are expecting the adoption of ATML TD standards to reduce the development and maintenance costs of TPS and expecting the adoption of Test Results to facilitate sharing the test outcomes up and down the maintenance chain of product. This paper discusses how to translate ATML TD to National Instruments (NI) TestStand TPS with ATML TD TestStand translator. Finally, a test report which conformance to ATML standards is generated.
Keywords
XML; NI teststand; automatic test markup language; national instruments; test program set; Instruments; Three dimensional displays; Variable speed drives; XML; ATML; ATS; NI TestStand; Test Description;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Science and Information Technology (ICCSIT), 2010 3rd IEEE International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-5537-9
Type
conf
DOI
10.1109/ICCSIT.2010.5564805
Filename
5564805
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