• DocumentCode
    1953561
  • Title

    Design quality and design efficiency; definitions, metrics and relevant design experiences

  • Author

    Aas, Einar J.

  • Author_Institution
    Dept. of Phys. Electron., Norwegian Univ. of Sci. & Technol., Norway
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    389
  • Lastpage
    394
  • Abstract
    Design quality metrics will be defined in terms of the probability that a completed design satisfies its specifications The definition rests on the concept of atomic design operations, and is by nature canonical. It is shown that this definition is truly analogous to test quality, leading to a unified model of test and design quality. Another important aspect of the design is its efficiency, related to design parameters. The metrics of design efficiency may be expressed as a cost function, and different design proposals may be evaluated against estimated design efficiency. Examples from several years of graduate level student design experiments will be given in order to demonstrate the usefulness of these metrics
  • Keywords
    design engineering; probability; quality control; atomic design operations; cost function; design efficiency; design experiences; design parameters; design quality; probability; test quality; Costs; Data mining; Design optimization; Digital circuits; Electrical capacitance tomography; Error correction; Manufacturing processes; Process design; Semiconductor device measurement; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2000. ISQED 2000. Proceedings. IEEE 2000 First International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7695-0525-2
  • Type

    conf

  • DOI
    10.1109/ISQED.2000.838902
  • Filename
    838902