DocumentCode
1953632
Title
A Linear Sweep Technique for Determining Generation Lifetimes in Soi Mosfets
Author
Venkatesan, S. ; Pierret, R.F. ; Neudeck, G.W.
Author_Institution
School of Electrical Engineering, Purdue University, IN
fYear
1992
fDate
6-8 Oct. 1992
Firstpage
120
Lastpage
121
Keywords
Charge-coupled image sensors; Leakage current; MOSFETs; P-n junctions; Pulse measurements; Semiconductor diodes; Semiconductor films; Semiconductor materials; Steady-state; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
SOI Conference, 1992. IEEE International
Conference_Location
Ponte Vedra Beach, FL
ISSN
1078-621X
Print_ISBN
0-7803-7439-8
Type
conf
DOI
10.1109/SOI.1992.664823
Filename
664823
Link To Document