• DocumentCode
    1953786
  • Title

    The Improved Reversal Method for Measurement of Geometric Error in Linear Manipulator of Ultra Precision

  • Author

    Kwang-Il Lee ; Jae-Chang Lee ; Seung-Han Yang

  • Author_Institution
    Sch. of Mech. Eng., Kyungpook Nat. Univ., Daegu, South Korea
  • fYear
    2013
  • fDate
    29-31 Jan. 2013
  • Firstpage
    127
  • Lastpage
    131
  • Abstract
    In this paper, novel reversal method is proposed to estimate the straightness errors (horizontal/vertical) and angular errors (pitch/yaw) of a linear axis using two capacitive sensors and a measurement target. These errors are estimated using the data of capacitive sensors including the standard uncertainty of sensors, itself. So the standard uncertainty of sensors would adversely affect the standard uncertainty of estimated geometric errors. It is affected by the relative position between reference coordinate system and sensors because of Abbe´s error. To solve this problem, proposed reversal method optimizes the relative position between reference coordinate system and sensors for minimum standard uncertainty of estimated geometric errors. The estimated geometric errors using proposed method is compared with the measured data using the laser interferometer. In the difference of these data, the maximum deviations of straightness errors are within 1 micrometer, 1.5 the arcsec for angular errors respectively. This difference value is resolution level of machine tool used at experiment, so the proposed reversal method reveals the validity.
  • Keywords
    capacitive sensors; geometry; light interferometers; machine tools; manipulators; Abbe error; angular error estimation; capacitive sensors; difference value; geometric error measurement; improved reversal method; laser interferometer; linear manipulator; machine tool; maximum deviations; measurement target; minimum standard uncertainty; reference coordinate system; relative position; resolution level; straightness error estimation; ultra precision; Capacitive sensors; Machine tools; Measurement uncertainty; Semiconductor device measurement; Standards; Uncertainty; Geometric error; Reference coordinate system; Reversal method; Standard uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Systems Modelling & Simulation (ISMS), 2013 4th International Conference on
  • Conference_Location
    Bangkok
  • ISSN
    2166-0662
  • Print_ISBN
    978-1-4673-5653-4
  • Type

    conf

  • DOI
    10.1109/ISMS.2013.32
  • Filename
    6498249