DocumentCode
1953805
Title
Some Metrics for Accessing Quality of Product Line Architecture
Author
Zhang, Tao ; Deng, Lei ; Wu, Jian ; Zhou, Qiaoming ; Ma, Chunyan
Author_Institution
Sch. of Software & Microelectron., Northwestern Polytech. Univ., Xian
Volume
2
fYear
2008
fDate
12-14 Dec. 2008
Firstpage
500
Lastpage
503
Abstract
Product line architecture is the most important core asset of software product line. vADL, a product line architecture description languages, can be used for specifying product line architecture, and also provide enough information for measuring quality of product line architecture. In this paper, some new metrics are provided to assess similarity, variability, reusability, and complexity of product line architecture. The main feature of our approach is to assess the quality of product line architecture by analyzing its formal vADL specification, and therefore the process of metric computation can be automated completely.
Keywords
formal specification; software architecture; software metrics; software quality; formal vADL specification; product line architecture description languages; product line architecture specification; quality accessment; software metrics; software product line; Architecture description languages; Computer architecture; Computer science; Connectors; Microelectronics; Programmable logic arrays; Software engineering; Software measurement; Software metrics; Software quality; architecture description language; product line architecture; software metrics; variability;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Science and Software Engineering, 2008 International Conference on
Conference_Location
Wuhan, Hubei
Print_ISBN
978-0-7695-3336-0
Type
conf
DOI
10.1109/CSSE.2008.500
Filename
4722101
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