• DocumentCode
    1953805
  • Title

    Some Metrics for Accessing Quality of Product Line Architecture

  • Author

    Zhang, Tao ; Deng, Lei ; Wu, Jian ; Zhou, Qiaoming ; Ma, Chunyan

  • Author_Institution
    Sch. of Software & Microelectron., Northwestern Polytech. Univ., Xian
  • Volume
    2
  • fYear
    2008
  • fDate
    12-14 Dec. 2008
  • Firstpage
    500
  • Lastpage
    503
  • Abstract
    Product line architecture is the most important core asset of software product line. vADL, a product line architecture description languages, can be used for specifying product line architecture, and also provide enough information for measuring quality of product line architecture. In this paper, some new metrics are provided to assess similarity, variability, reusability, and complexity of product line architecture. The main feature of our approach is to assess the quality of product line architecture by analyzing its formal vADL specification, and therefore the process of metric computation can be automated completely.
  • Keywords
    formal specification; software architecture; software metrics; software quality; formal vADL specification; product line architecture description languages; product line architecture specification; quality accessment; software metrics; software product line; Architecture description languages; Computer architecture; Computer science; Connectors; Microelectronics; Programmable logic arrays; Software engineering; Software measurement; Software metrics; Software quality; architecture description language; product line architecture; software metrics; variability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Science and Software Engineering, 2008 International Conference on
  • Conference_Location
    Wuhan, Hubei
  • Print_ISBN
    978-0-7695-3336-0
  • Type

    conf

  • DOI
    10.1109/CSSE.2008.500
  • Filename
    4722101