• DocumentCode
    1953838
  • Title

    Design of totally self-checking checkers for Bose-Lin, Bose and Blaum codes

  • Author

    Jha, Niraj K.

  • Author_Institution
    Dept. of Electr. Eng., Princeton Univ., NJ, USA
  • fYear
    1989
  • fDate
    14-16 Aug 1989
  • Firstpage
    32
  • Abstract
    Some efficient systematic codes have recently been developed for detecting t unidirectional errors (Bose-Lin code) and burst unidirectional errors (Bose, Blaum codes). Since unidirectional errors are the most common errors in VLSI circuits, such codes should find widespread use. Totally self-checking (TSC) checker designs have been found for the three codes mentioned above. The designs are easily testable, economical, and have a modular structure. The design for the Bose-Lin code requires at most only 8r-4 codeword tests, where r is the number of checkbits. The number of codeword tests for the TSC checkers for the Bose code and the Blaum code is at most 8r +4 and 2´+8r, respectively
  • Keywords
    VLSI; error detection codes; fault tolerant computing; Blaum codes; Bose code; Bose-Lin code; VLSI circuits; burst unidirectional errors; codeword tests; modular structure; systematic codes; totally self-checking checkers; unidirectional errors; Circuit faults; Circuit testing; Decoding; Electrical fault detection; Encoding; Fault detection; Monitoring; Protection; Semiconductor memory; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1989., Proceedings of the 32nd Midwest Symposium on
  • Conference_Location
    Champaign, IL
  • Type

    conf

  • DOI
    10.1109/MWSCAS.1989.101788
  • Filename
    101788