DocumentCode
1953846
Title
Simulation of diffusion controlled intermetallic formation of Au/Al interface
Author
Huang, Rui ; Tan, Yik Yee ; Walter, Juergen ; Pape, Heinz ; Fan, Xuejun ; Koerner, Heinrich
Author_Institution
Infineon Technol. AG, Neubiberg, Germany
fYear
2012
fDate
16-18 April 2012
Firstpage
42376
Lastpage
42558
Abstract
This paper describes the finite element simulation for diffusion controlled intermetallic formation of Au/Al interface during the wire bonding process. The analogous correlation between the intermetallic atomic diffusion and the heat transport is introduced, and the simulation of intermetallic diffusion using a commercial finite element method (FEM) tool ANSYS is demonstrated. Phase dependent diffusivities have been implemented into the material model in order to more accurately model the distribution of diffusing atomic concentration. The various phases of intermetallic compounds (IMCs) can be determined briefly by the obtained atomic concentration profile from FEM and the phase composition table. The overall thickness of the IMCs layer can then be calculated. In this paper, the concept for the subsequent stress analysis based on the volume change due to diffusion is also discussed.
Keywords
aluminium; diffusion bonding; finite element analysis; gold; lead bonding; stress analysis; Au-Al; FEM tool ANSYS; IMC; atomic concentration; diffusion controlled intermetallic formation; finite element simulation; heat transport; intermetallic atomic diffusion; phase composition table; phase dependent diffusivity; stress analysis; wire bonding process; Artificial intelligence; Copper; Ear; Gold; Quantum mechanics;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2012 13th International Conference on
Conference_Location
Cascais
Print_ISBN
978-1-4673-1512-8
Type
conf
DOI
10.1109/ESimE.2012.6191791
Filename
6191791
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