Title :
A fault-tolerant scheme that copes with intermittent and transient faults in sequential circuits
Author :
Roberts, Morien W.
Author_Institution :
Dept. of Electr. & Comput. Eng., Clarkson Univ., Potsdam, NY, USA
Abstract :
The vulnerability of fault-tolerant schemes, such as TMR (triple modular redundancy), to nonpermanent faults, such as intermittent and transient faults, is discussed. A methodology that can be used to design circuits so that they can better tolerate such faults is described. The problem of nonpermanent faults producing semipermanent faults in sequential circuits is addressed
Keywords :
fault tolerant computing; logic design; sequential circuits; fault-tolerant scheme; intermittent faults; logic design; nonpermanent faults; semipermanent faults; sequential circuits; transient faults; triple modular redundancy; Circuit faults; Circuit testing; Delay; Electromagnetic transients; Fault tolerance; Hardware; Nuclear magnetic resonance; Redundancy; Sequential circuits; Temperature;
Conference_Titel :
Circuits and Systems, 1989., Proceedings of the 32nd Midwest Symposium on
Conference_Location :
Champaign, IL
DOI :
10.1109/MWSCAS.1989.101789
