Title :
Thermal challenges in Photonic Integrated Circuits
Author_Institution :
Stokes Inst., Univ. of Limerick, Limerick, Ireland
Abstract :
Photonics Integrated Circuits (PICs), a feature of contemporary optical communications technologies, can represent a stringent packaging challenge, particularly in terms of their requirements for thermal control. Devices such as laser arrays can demonstrate tight temperature limits, sub-ambient operating temperatures, moderate heat loads but high device-level heat fluxes. A key feature of many hybrid PICs is a multi-layer substrate which offers mechanical support, electrical interconnection and heat spreading for the devices that it carries; such substrates are typically mounted on a thermoelectric module (TEM) to achieve thermal control. This paper considers two thermal challenges associated with such PICs, in order to ensure their efficient operation: the requirement for aggressive heat sinking; and the imperative of adequate heat spreading within the substrate on the temperature controlled side of the TEM. To this end, a closed-form electrothermal model is developed for a representative PIC which captures the conductive heat transfer within the substrate, coupled with a constitutive representation of the TEM and its heat sink. An example of a laser array PIC is considered in order to illustrate the importance of heat sinking and spreading. This paper represents some initial results of an extensive programme of work on packaging-related aspects of next-generation PICs.
Keywords :
heat sinks; integrated optics; aggressive heat sinking; closed-form electrothermal model; conductive heat transfer; contemporary optical communications technology; device-level heat flux; electrical interconnection; heat spreading; hybrid PIC; laser array PIC; mechanical support; multilayer substrate; next generation PIC; packaging-related aspects; photonic integrated circuits; representative PIC; stringent packaging challenge; sub-ambient operating temperature; thermal control; thermoelectric module; Arrays; Conductivity; Heating; Materials; Photonics; Temperature measurement; Voltage measurement;
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2012 13th International Conference on
Conference_Location :
Cascais
Print_ISBN :
978-1-4673-1512-8
DOI :
10.1109/ESimE.2012.6191810