DocumentCode :
1954311
Title :
RoHS-conform thick-film resistors on LTCC- and alumina substrates
Author :
Hrovat, Marko ; Belavic, Darko ; Makarovic, Kostja
Author_Institution :
Jozef Stefan Inst., Ljubljana, Slovenia
fYear :
2013
fDate :
8-12 May 2013
Firstpage :
290
Lastpage :
294
Abstract :
Commercial lead-free thick-film resistors Du Pont CF-041, Ferro FX-87-B and Heraeus R-2141 with nominal sheet resistivities 10 kohm/sq. were printed and fired on alumina and LTCC substrates. The conductive phase - RuO2 - in resistors was determined by X-ray powder diffraction analysis (XRD). Electrical characteristics, i.e., sheet resistivities, noise and gauge factors were measured. The microstructures and chemical composition of fired resistors were investigated by SEM and EDS.
Keywords :
RoHS compliance; X-ray chemical analysis; X-ray diffraction; ceramic packaging; crystal microstructure; ruthenium compounds; scanning electron microscopy; thick film resistors; Al2O3; Du Pont CF-041; EDS; Ferro FX-87-B; Heraeus R-2141; LTCC-substrates; RoHS-conform thick-film resistors; RuO2; SEM; X-ray powder diffraction analysis; XRD; alumina substrates; chemical composition; commercial lead-free thick-film resistors; conductive phase; electrical characteristics; fired resistors; microstructures; nominal sheet resistivity; Conductivity; Glass; Lead; Noise; Resistors; Substrates; Thick films;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Technology (ISSE), 2013 36th International Spring Seminar on
Conference_Location :
Alba Iulia
ISSN :
2161-2528
Type :
conf
DOI :
10.1109/ISSE.2013.6648259
Filename :
6648259
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1954311
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