• DocumentCode
    1954548
  • Title

    Coupled thermal-fully hydrodynamic simulation of InP-based HBTs

  • Author

    Benvenuti, A. ; Ghione, G. ; Pinto, M.R. ; Coughran, W.M., Jr. ; Schryer, N.L.

  • Author_Institution
    Dipartimento di Elettronica, Politecnico di Torino, Italy
  • fYear
    1992
  • fDate
    13-16 Dec. 1992
  • Firstpage
    737
  • Lastpage
    740
  • Abstract
    We analyzed the self-consistent thermal and electrical behavior of InP-GaInAs heterojunction bipolar transistors (HBTs) with a coupled 1D thermal-fully hydrodynamic model, discretized with an improved upwinding scheme. Taking advantage of the flexibility allowed by our software approach, the role of convective terms and thermal effects is demonstrated by comparison with previous models.<>
  • Keywords
    III-V semiconductors; digital simulation; electronic engineering computing; gallium arsenide; heterojunction bipolar transistors; indium compounds; semiconductor device models; thermal analysis; InP-GaInAs; InP-based HBTs; coupled thermal-fully hydrodynamic simulation; heterojunction bipolar transistors; thermal effects; upwinding scheme; Gallium compounds; Heterojunction bipolar transistors; Indium compounds; Semiconductor device modeling; Simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1992. IEDM '92. Technical Digest., International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-0817-4
  • Type

    conf

  • DOI
    10.1109/IEDM.1992.307464
  • Filename
    307464