DocumentCode
1954573
Title
Activation of Nbti Degradation in Soi Pmos by Self-Heating
Author
Bunyan, R.J.T. ; Uren, M.J. ; Alderman, J.C. ; Eccleston, W.
Author_Institution
Dept. of Elec. Eng. and Electronics, University of Liverpool, UK
fYear
1992
fDate
6-8 Oct. 1992
Firstpage
130
Lastpage
131
Keywords
Charge measurement; Current measurement; Degradation; Density measurement; Energy measurement; MOS devices; Niobium compounds; Temperature distribution; Titanium compounds; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
SOI Conference, 1992. IEEE International
Conference_Location
Ponte Vedra Beach, FL
ISSN
1078-621X
Print_ISBN
0-7803-7439-8
Type
conf
DOI
10.1109/SOI.1992.664827
Filename
664827
Link To Document