Title :
Distributed diagnostic simulation of stuck-at faults in sequential circuits
Author :
Venkataraman, Srikanth ; Fuchs, W. Kent
Author_Institution :
Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
Abstract :
This paper describes the parallelization of a diagnostic fault simulator for stuck-at faults in sequential circuits. The parallelization is performed by partitioning the diagnostic equivalence classes obtained by simulating the first few test vectors of the test set. The partitions are then simulated in parallel, independent of each other for the remaining vectors. Thus there is no communication overhead. Results on performance speedup and diagnostic resolution loss are provided for the ISCAS 89 benchmark circuits
Keywords :
circuit analysis computing; fault diagnosis; integrated circuit testing; integrated logic circuits; logic testing; parallel algorithms; sequential circuits; distributed diagnostic simulation; parallelization; partitioning strategy; sequential circuits; stuck-at faults; Benchmark testing; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Computer simulation; Fault diagnosis; Performance loss; Sequential circuits; Workstations;
Conference_Titel :
VLSI Design, 1997. Proceedings., Tenth International Conference on
Conference_Location :
Hyderabad
Print_ISBN :
0-8186-7755-4
DOI :
10.1109/ICVD.1997.568157
