• DocumentCode
    1954627
  • Title

    Measurement of end-hat effects in a crossed-field amplifier

  • Author

    Browning, J. ; Chung Chan ; Ye, J. ; MacGregor, R. ; Ruden, T.E.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA
  • fYear
    1992
  • fDate
    13-16 Dec. 1992
  • Firstpage
    755
  • Lastpage
    758
  • Abstract
    A linear format, low frequency (150 MHz), low power (10 to 100 W), crossed-field amplifier is operated with variable bias, electrostatic confining electrodes (end-hats). The end-hat bias is found to cause electron transport only in the vicinity of the end-hats. End-hat current measurements indicate a substantial part of the electron beam current (40%) can be collected when the end-hats are biased more positive than the floating potential. The observed change in gain versus end-hat bias can be accounted for by the lost beam current. Device gain versus sole bias measurements have been compared with numerical simulations and give general agreement.<>
  • Keywords
    electrodes; electron tubes; microwave tubes; radiofrequency amplifiers; 10 to 100 W; 150 MHz; VHF; crossed-field amplifier; current measurements; electron beam current; electrostatic confining electrodes; end-hat effects; linear format; low power; variable bias; Electrodes; Electron tubes; Microwave tubes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1992. IEDM '92. Technical Digest., International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-0817-4
  • Type

    conf

  • DOI
    10.1109/IEDM.1992.307468
  • Filename
    307468