Title :
An efficient algorithm to design convolved LFSR/SR
Author :
El-Mahlawy, Mohamed H. ; Waller, Winston
Author_Institution :
Electron. Eng. Labs., Kent Univ., Canterbury, UK
Abstract :
We present an efficient algorithm to design convolved LFSR/SRs (linear feedback shift register/shift registers). Convolved LFSR/SR is considered to be the most efficient pseudoexhaustive test pattern generator as far as the lengths of test set and hardware overhead are concerned. We present an efficient search algorithm to assign the residues to the inputs of the circuit under test (CUT) so as to increase the number of potential solutions and thus reduce the hardware overhead. The experimental results indicate the efficiency of the approach
Keywords :
circuit feedback; combinational circuits; convolution; logic testing; network synthesis; search problems; shift registers; circuit under test; convolved LFSR/SR design; efficient search algorithm; experimental results; hardware overhead reduction; linear feedback shift register/shift registers; pseudoexhaustive test pattern generator; residues; test set length; Algorithm design and analysis; Circuit faults; Circuit testing; Combinational circuits; Counting circuits; Feeds; Hardware; Shift registers; Strontium; Test pattern generators;
Conference_Titel :
Radio Science Conference, 2000. 17th NRSC '2000. Seventeenth National
Conference_Location :
Minufiya
Print_ISBN :
977-5031-64-8
DOI :
10.1109/NRSC.2000.838952
