Title :
Two-port noise characterisation based on double-sideband noise power measurements
Author_Institution :
Inst. of Electron. Syst., Warsaw Univ. of Technol., Poland
Abstract :
A new model for the source-pull noise characterisation of two-ports based on double-sideband output noise power measurements is introduced. The model accounts for uneven noise contribution from each sideband due to frequency variation of both the gain and the source reflection coefficient. It is dedicated for low-cost on-wafer noise measurement systems utilising an impedance tuner with a long interconnecting cable to the device tested.
Keywords :
electric noise measurement; microwave measurement; radiometers; two-port networks; double-sideband noise power measurements; frequency variation; gain; interconnecting cable; on-wafer noise measurement systems; output noise power; source reflection coefficient; source-pull noise characterisation; two-port noise characterisation; uneven noise contribution; Acoustic reflection; Impedance; Noise measurement; Performance evaluation; Power measurement; Power system modeling; Radiometry; Temperature; Testing; Tuners;
Conference_Titel :
Microwaves, Radar and Wireless Communications, 2002. MIKON-2002. 14th International Conference on
Print_ISBN :
83-906662-5-1
DOI :
10.1109/MIKON.2002.1017916
