• DocumentCode
    1955229
  • Title

    Initial Evaluation of Cmos/soi Devices Fabricated on Plasma-Thinned Bonded Silicon Wafers

  • Author

    Aubuchon, K. ; Pinter, J. ; Matloubian, M. ; Barger, M. ; McClain, R. ; Marsh, O.

  • Author_Institution
    Hughes Aircraft Company, CA
  • fYear
    1992
  • fDate
    6-8 Oct. 1992
  • Firstpage
    154
  • Lastpage
    155
  • Keywords
    Circuit testing; Electric breakdown; Fabrication; Insulation; Plasma applications; Plasma chemistry; Plasma devices; Silicon on insulator technology; Thick film circuits; Wafer bonding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOI Conference, 1992. IEEE International
  • Conference_Location
    Ponte Vedra Beach, FL
  • ISSN
    1078-621X
  • Print_ISBN
    0-7803-7439-8
  • Type

    conf

  • DOI
    10.1109/SOI.1992.664837
  • Filename
    664837