Title :
X-Band Trapatt Oscillators
Author :
Grace, M. ; Kroger, H. ; Bozler, C. ; Gsteiger, K.
Author_Institution :
Sperry Research Center, 100 North RD., Sudbury, Massachusetts
Keywords :
Circuit testing; Coaxial components; Frequency; Heat sinks; Microwave circuits; Oscillators; Packaging; Semiconductor diodes; Silicon; Substrates;
Conference_Titel :
Microwave Conference, 1973. 3rd European
Conference_Location :
Brussels, Belgium
DOI :
10.1109/EUMA.1973.331619
