Title :
A 20ns Multiple Architecture 256k Simox Sram Designed for Harsh Radiation Environments
Author :
Kraus, William F. ; Doyle, Brent R. ; Clark, Jack E. ; Jones, Kenneth L. ; Thornberry, D.M.
Author_Institution :
Harris Semiconductor Military and Aerospace Division, Melbourne, Florida
Keywords :
Capacitors; Decoding; Geometry; Laser modes; Lifting equipment; Packaging; Random access memory; Substrates; Tungsten; Voltage;
Conference_Titel :
SOI Conference, 1992. IEEE International
Conference_Location :
Ponte Vedra Beach, FL
Print_ISBN :
0-7803-7439-8
DOI :
10.1109/SOI.1992.664843
