مرکز منطقه ای اطلاع رساني علوم و فناوري - Comparison of Soi Versus Bulk Silicon Substrate Crosstalk Properties for Mixed-Mode IC´s

DocumentCode :

1955351

Title :

Comparison of Soi Versus Bulk Silicon Substrate Crosstalk Properties for Mixed-Mode IC´s

Author :

Rahim, Irfan ; Hwang, Bor-yuan ; Foerstner, Juergen

Author_Institution :

Advanced Custom Technology, Motorola Inc., Mesa, Arizona

fYear :

1992

fDate :

6-8 Oct. 1992

Firstpage :

170

Lastpage :

171

Keywords :

Analog integrated circuits; Crosstalk; Digital integrated circuits; Frequency; Insulation; Integrated circuit technology; Probes; Scattering parameters; Silicon on insulator technology; Testing;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

SOI Conference, 1992. IEEE International

Conference_Location :

Ponte Vedra Beach, FL

ISSN :

1078-621X

Print_ISBN :

0-7803-7439-8

Type :

conf

DOI :

10.1109/SOI.1992.664844

Filename :

664844

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1955351