Title :
A precise measurement of quality factor for Planar Microtoroid Resonators
Author :
Shubin, I. Yan ; Yingzhan Yan ; Ji, I. Zhe ; Baohua Wang ; Shaohui Wang ; Guoqing Jiang ; Jijun Xiong ; Ye, Xiongying ; Zhou, Zhaoying ; Wendong Zhang
Author_Institution :
Nat. Key Lab. For Electron. Meas. Technol., North Univ. Of China, Taiyuan
Abstract :
The quality factor(Q) parameter is the most important parameter for optical micro cavities. In this paper, we present the Planar Microtoroid Resonators fabricated in our laboratory. Then, measuring methods common used are introduced. After that, a precise measurement of quality factor is demonstrated in which the photon lifetime was directly measured by cavity ringdown. This is done by repeatedly scanning the laser into resonance with a mode that was critically coupled to the taper. As the laser scanned into resonance, the power transferred into the cavity increased until the maximal power of the resonant mode was attained. At this moment, an external modulator is used to cut-off the pumping laser. As the resonant power outpouring, a cavity ringdown spectrum is observed and recorded. The cavity lifetime can be obtained through analyzing the spectrum. Finally, the quality factor is estimated from the cavity lifetime which is consistent with the widely used measurement of the frequency line shape.
Keywords :
Q-factor; optical resonators; optical micro cavities; photon lifetime; planar microtoroid resonators; quality factor; Frequency estimation; Laser beam cutting; Laser modes; Optical pumping; Optical resonators; Pump lasers; Q factor; Resonance; Ring lasers; Shape measurement; Planar Microtoroid Resonators; Quality factor; cavity ringdown; photon lifetime;
Conference_Titel :
Nano/Micro Engineered and Molecular Systems, 2009. NEMS 2009. 4th IEEE International Conference on
Conference_Location :
Shenzhen
Print_ISBN :
978-1-4244-4629-2
Electronic_ISBN :
978-1-4244-4630-8
DOI :
10.1109/NEMS.2009.5068516