Title :
Observations of secondary electron emission from diamond films
Author :
Bekker, T.L. ; Dayton, J.A., Jr. ; Gilmour, A.S., Jr. ; Krainsky, I.L. ; Rose, M.F. ; Rameshan, R. ; File, D. ; Mearini, G.
Author_Institution :
Naval Surface Warfare Center, Port Hueneme, CA, USA
Abstract :
Secondary electron yields have been measured at NASA Lewis Research Center on diamond and diamond-like-carbon (DLC) films prepared at Auburn University. These results have been obtained as part of a study initiated by the Naval Surface Warfare Center. Secondary yields as high as 27 have been measured for the diamond films; the DLC films have maximum yields near 1.5. Secondary yields from the diamond films decline when they are subjected to continuous electron bombardment, but emission can be restored or enhanced if the surface is annealed in vacuum or exposed to hydrogen gas.<>
Keywords :
annealing; diamond; elemental semiconductors; secondary electron emission; semiconductor thin films; C; H/sub 2/; H/sub 2/ gas exposure; annealing; continuous electron bombardment; diamond films; diamond-like-carbon films; secondary electron emission; Annealing; Diamond; Electron emission; Semiconductor films;
Conference_Titel :
Electron Devices Meeting, 1992. IEDM '92. Technical Digest., International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-0817-4
DOI :
10.1109/IEDM.1992.307513