Title :
A tool for hierarchical test generation
Author_Institution :
Nixdorf Comput. AG, Paderborn, West Germany
Abstract :
An extended system for automatic test generation and its algorithm are presented. In a hierarchical mixed-level approach (from gate- to system-level), test patterns for sequential circuits of arbitrary depth, and even test programs for either external or self-test of microprocessor boards or processor systems, can be generated automatically. In a complete hierarchy, lower bounds for test coverage are easily computable. Applications in real production-line testing have shown good results.<>
Keywords :
automatic testing; circuit analysis computing; integrated circuit testing; logic testing; microprocessor chips; sequential circuits; automatic test generation; external testing; gate level approach; hierarchical mixed-level approach; microprocessor boards; production-line testing; self testing; sequential circuits; system level approach; test coverage lower bounds; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Hardware; Microprocessors; Sequential analysis; Software testing; System testing; Test pattern generators;
Conference_Titel :
Computer-Aided Design, 1988. ICCAD-88. Digest of Technical Papers., IEEE International Conference on
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-8186-0869-2
DOI :
10.1109/ICCAD.1988.122541
