Title :
NCUBE: an automatic test generation program for iterative logic arrays
Author :
Chatterjee, A. ; Abraham, J.A.
Author_Institution :
Illinois Univ., Urbana, IL, USA
Abstract :
NCUBE applies all possible input patterns to each array cell while ensuring that the effects of incorrect transitions are observable at the array outputs. If the array is testable with a constant number of test vectors irrespective of its size (C-testable), then NCUBE generates the constant-size test set for the array. If the array cannot be tested with a constant number of test vectors, then the test size is proportional either to the number of rows or columns of the array or to the number of cells. In that case, NCUBE generates a minimal or near-minimal test set that depends on the size of the array.<>
Keywords :
automatic testing; circuit analysis computing; integrated circuit testing; iterated switching networks; logic arrays; C-testable array; NCUBE; array size; automatic test generation program; constant-size test set; incorrect transitions; input patterns; iterative logic arrays; near-minimal test set; test vectors; Automatic logic units; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Logic arrays; Logic circuits; Logic testing; Programmable logic arrays; Very large scale integration;
Conference_Titel :
Computer-Aided Design, 1988. ICCAD-88. Digest of Technical Papers., IEEE International Conference on
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-8186-0869-2
DOI :
10.1109/ICCAD.1988.122542
