• DocumentCode
    1956015
  • Title

    The pico-Newton order force measurement with a calibrated carbon nanotube probe

  • Author

    Arai, Fumihito ; Nakajima, Masahiro ; Dong, Lixin ; Fukuda, Toshio

  • Author_Institution
    Dept. of Micro Syst. Eng., Nagoya Univ., Japan
  • Volume
    2
  • fYear
    2003
  • fDate
    20-24 July 2003
  • Firstpage
    691
  • Abstract
    Force measurement with pico-Newton (pN) order resolution using a carbon nanotube (CNT) probe, which is calibrated by the electromechanical resonance, is presented. Based on the theoretical analysis, a CNT is suitable material for the sensitive force measurement. A CNT probe is constructed by attaching a CNT to the tip of the commercial available atomic force microscope (AFM) cantilever or tungsten needle probe by the electron-beam-induced deposition (EBID) though the nanorobotic manipulators inside a field-emission scanning electron microscope (FE-SEM). In order to attach a CNT quickly and correctly, CNTs are dispersed in ethanol by ultrasonic waves for several hours and oriented by electrophoresis. The elastic moduli of CNTs are calibrated from electromechanical resonance frequency by applied electrostatic forces. We measured pico-Newton order contact forces with a CNT probe, which is constructed with nanorobotic manipulators, by measuring deformation of a CNT probe from FE-SEM images.
  • Keywords
    carbon nanotubes; deformation; elastic moduli; electron beam deposition; electrophoresis; force measurement; micromanipulators; nanotechnology; scanning electron microscopy; ultrasonic effects; C; applied electrostatic forces; atomic force microscope; calibrated carbon nanotube probe; deformation; elastic modulus; electromechanical resonance; electromechanical resonance frequency; electron beam induced deposition; electrophoresis; field emission scanning electron microscopy; nanorobotic manipulators; pico-Newton order force measurement; sensitive force measurement; tungsten needle probe; ultrasonic waves; Atomic force microscopy; Atomic layer deposition; Carbon nanotubes; Electrostatic measurements; Force measurement; Joining processes; Probes; Resonance; Scanning electron microscopy; Ultrasonic variables measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Intelligent Mechatronics, 2003. AIM 2003. Proceedings. 2003 IEEE/ASME International Conference on
  • Print_ISBN
    0-7803-7759-1
  • Type

    conf

  • DOI
    10.1109/AIM.2003.1225427
  • Filename
    1225427