DocumentCode
1956103
Title
Estimation of sound velocity based on evaluation of edge conspicuity
Author
Seo, Haijin ; Lee, Yuhwa ; Yoo, Yangmo ; Song, Taikyong ; Chang, Jin Ho
Author_Institution
Dept. of Electron. Eng., Sogang Univ., Seoul, South Korea
fYear
2010
fDate
11-14 Oct. 2010
Firstpage
1751
Lastpage
1754
Abstract
In this paper, a new method is proposed to minimize defocusing effects due to wrong selection of sound velocity used in dynamic receive beamforming. To find an optimal sound velocity, the proposed method calculates the degree of edge conspicuity by using a nonlinear anisotropic diffusion (NAD) technique. For this, images are formed with different sound velocities ranging 1400 to 1600 m/s and subsequently the region of interest (ROI) is chosen. In ROI, the degrees of edge conspicuity are calculated. The sound velocity can be considered as an optimal one for the ROI if it is used for the image that provides the maximum degree of edge conspicuity. To evaluate the performances of proposed method, pre-beamformed RF data were acquired from a phantom with a sound velocity of 1460 m/s by using a commercial ultrasound scanner (SA-9900, Medison, Corp., Korea) and the edge gradient was calculated. The estimation error and variance were 0.99% and 9.89%, respectively. These results indicate that the proposed method for sound velocity estimation is capable of providing accurate and consistent sound velocity in the ROI.
Keywords
acoustic signal processing; array signal processing; biomedical ultrasonics; phantoms; ultrasonic focusing; ultrasonic velocity; commercial ultrasound scanner; defocusing effect; dynamic receive beamforming; edge conspicuity evaluation; nonlinear anisotropic diffusion technique; phantom; sound velocity estimation; Array signal processing; Estimation; Image edge detection; Phantoms; Radio frequency; Speckle; Ultrasonic imaging; Adaptive beamforming; nonlinear anisotropic diffusion; sound speed estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium (IUS), 2010 IEEE
Conference_Location
San Diego, CA
ISSN
1948-5719
Print_ISBN
978-1-4577-0382-9
Type
conf
DOI
10.1109/ULTSYM.2010.5935654
Filename
5935654
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