DocumentCode :
1956107
Title :
Amorphous selenium based X-ray detectors
Author :
Marcovici, Sorb
fYear :
2001
fDate :
2001
Firstpage :
193
Lastpage :
196
Abstract :
A novel, simpler, competing technology was developed to detect X-ray quanta by a "direct conversion" process from X-ray to electrical charge. Although there are several photoconductor materials with promising characteristics, amorphous selenium has proven so far to have the most appealing combination of characteristics suitable for high resolution X-ray detection. The paper will introduce the basic operating principles of an innovative, amorphous selenium based, X-ray detector developed and manufactured by ANRAD Corporation, a Canadian wholly owned subsidiary of Analogic Corporation, Peabody, MA
Keywords :
X-ray detection; amorphous semiconductors; elemental semiconductors; nondestructive testing; radiology; selenium; ANRAD Corporation; Se; X-ray detectors; direct conversion process; high resolution detection; operating principles; Amorphous materials; Dynamic range; Electrodes; Object detection; Photoconducting materials; Photodetectors; Radiology; Spatial resolution; X-ray detection; X-ray detectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors for Industry, 2001. Proceedings of the First ISA/IEEE Conference
Conference_Location :
Rosemont, IL
Print_ISBN :
0-7803-6659-X
Type :
conf
DOI :
10.1109/SFICON.2001.968528
Filename :
968528
Link To Document :
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