• DocumentCode
    1956188
  • Title

    High Performance Organic Field Effect Transistor with Tri-Gate

  • Author

    Agrahari, D.K. ; Kondekar, P.N. ; Yadav, P.S. ; Singh, Jaskirat

  • Author_Institution
    Electron. & Commun. Eng., PDPM Indian Inst. of Inf. Technol. Design & Manuf., Jabalpur, India
  • fYear
    2013
  • fDate
    29-31 Jan. 2013
  • Firstpage
    627
  • Lastpage
    630
  • Abstract
    In this paper, improvements are reported in terms of device performance by modification in the device geometry of bottom gate staggered organic field effect transistor (OFET). The device geometry with three independent gates is investigated at different gate voltages and detailed studies of the devices are simulated with the help of 2-D simulator (Atlas simulator by Silvaco). In the proposed device the electric field is improved and charge accumulation at the Pentacene-oxide interface are significantly enhanced. An analytical model for improved electric field is presented for this device. The simulated results show the improved drive current performance as compared to the single bottom gate staggered OFET at lower gate voltage. Due to lower operating voltage the device electrical stability and device operating time is improved.
  • Keywords
    organic field effect transistors; semiconductor device models; 2D simulator; Atlas simulator; Silvaco; analytical model; device electrical stability; device geometry; device operating time; device performance; drive current performance; electric field; gate staggered organic field effect transistor; gate voltages; independent gates; operating voltage; pentacene-oxide interface; single bottom gate staggered OFET; tri-gate; Electric fields; Geometry; Insulators; Logic gates; OFETs; Organic semiconductors; 2-D simulation; Device geometry; organic field-effect transistor (OFET);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Systems Modelling & Simulation (ISMS), 2013 4th International Conference on
  • Conference_Location
    Bangkok
  • ISSN
    2166-0662
  • Print_ISBN
    978-1-4673-5653-4
  • Type

    conf

  • DOI
    10.1109/ISMS.2013.126
  • Filename
    6498347