1956325

The Tolerance Problem in Optimal Design

Bandler, John W.

McMaster University, Hamilton, Ontario, Canada.

1

1973

4-7 Sept. 1973

1

6

Bibliographies; Circuit synthesis; Circuits and systems; Design optimization; Electrical capacitance tomography; Manufacturing; Microwave circuits; Optimization methods; Tolerance analysis; Uncertainty;

English

ieee

Microwave Conference, 1973. 3rd European

Brussels, Belgium

conf

10.1109/EUMA.1973.331617

4130200