DocumentCode
1956325
Title
The Tolerance Problem in Optimal Design
Author
Bandler, John W.
Author_Institution
McMaster University, Hamilton, Ontario, Canada.
Volume
1
fYear
1973
fDate
4-7 Sept. 1973
Firstpage
1
Lastpage
6
Keywords
Bibliographies; Circuit synthesis; Circuits and systems; Design optimization; Electrical capacitance tomography; Manufacturing; Microwave circuits; Optimization methods; Tolerance analysis; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1973. 3rd European
Conference_Location
Brussels, Belgium
Type
conf
DOI
10.1109/EUMA.1973.331617
Filename
4130200
Link To Document