Title :
A tunable bias-heating cancellation circuit for microbolometer readout electronics
Author :
Qian, Xinbo ; Xu, Yong Ping ; Karunasiri, Gamani
Author_Institution :
Electr. & Comput. Eng. Dept, Nat. Univ. of Singapore, Singapore
Abstract :
Microbolometer sensors are commonly used in uncooled infrared focal plane arrays. However, they unavoidably suffer from severe bias heating during readout. This paper describes a simple and yet effective on-chip bias heating cancellation method based on the equivalence between the electrical and thermal systems and uses a capacitor to mimic the thermal capacitance of the bolometer. The cancellation can be tuned by adjusting the discharging current of the capacitor to overcome the discrepancies arising from the accuracy of the bolometer´s thermal parameters. The bias heating cancellation circuit is described in detail and the performance of the circuit is verified by simulation results. A test chip has been fabricated and the test results shows that the bias heating can be effectively cancelled
Keywords :
bolometers; capacitors; circuit simulation; circuit tuning; electric heating; focal planes; infrared detectors; integrated circuit testing; microsensors; readout electronics; specific heat; bias heating; bias heating cancellation circuit; bolometer; bolometer thermal parameters; cancellation tuning; capacitor; capacitor discharging current; circuit performance; circuit simulation; electrical/thermal systems equivalence; microbolometer readout electronics; microbolometer sensors; on-chip bias heating cancellation method; readout; silicon micromachining technology; test chip; thermal capacitance; thin film microbolometer; tunable bias-heating cancellation circuit; uncooled infrared focal plane arrays; Bolometers; Capacitance; Capacitors; Circuit simulation; Circuit testing; Infrared sensors; Resistance heating; Sensor arrays; System-on-a-chip; Tunable circuits and devices;
Conference_Titel :
Sensors for Industry, 2001. Proceedings of the First ISA/IEEE Conference
Conference_Location :
Rosemont, IL
Print_ISBN :
0-7803-6659-X
DOI :
10.1109/SFICON.2001.968541