Title :
Simplified and practical estimation of package cracking during reflow soldering process
Author :
Sawada, K. ; Nakazawa, T. ; Kawamura, N. ; Matsumoto, K. ; Hiruta, Y. ; Sudo, T.
Author_Institution :
Semicond. Device Eng. Lab., Toshiba Corp., Kawasaki, Japan
Abstract :
A simple method has been developed to estimate cracking of plastic packages during reflow soldering process. A criterion for estimating package cracking has been introduced by comparing the mold resin fracture toughness and the maximum value of the stress intensity factor in the package. The criterion equation for package cracking was made to an empirical form. The real-time measurement of package deformation is effective for providing information on the difference of the fracture mode. The difference of the delamination in the package causes the different shape of the deformation curve. The absorption characteristic of the package obeys Fick´s law even for thinner packages.<>
Keywords :
circuit reliability; delamination; fracture toughness testing; packaging; soldering; Fick´s law; absorption characteristic; delamination; fracture mode; mold resin fracture toughness; package cracking; package deformation; plastic packages; real-time measurement; reflow soldering process; stress intensity factor; Absorption; Delamination; Electronics packaging; Moisture; Plastics; Reflow soldering; Resins; Semiconductor device packaging; Semiconductor devices; Stress;
Conference_Titel :
Reliability Physics Symposium, 1994. 32nd Annual Proceedings., IEEE International
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-7803-1357-7
DOI :
10.1109/RELPHY.1994.307848