DocumentCode :
1957018
Title :
The Influence of Permittivity of the Crack-Type Defects to the Scattered Far Field (TM-Case)
Author :
Nazarchuk, Z.T. ; Kulynych, Ya.P. ; Stadnik, T.M.
Author_Institution :
NASU, Lviv
fYear :
2007
fDate :
17-20 Sept. 2007
Firstpage :
77
Lastpage :
80
Abstract :
The influence of material´s permittivity of two thin cylindrical inclusions illuminated by a plain TM-polarized electromagnetic wave and some geometric parameters of appropriate diffraction problem on the far radiation field have been investigated in the paper.
Keywords :
electromagnetic wave diffraction; electromagnetic wave scattering; inclusions; crack type defects; far radiation field; geometric parameters; permittivity; polarized electromagnetic wave; scattered far field; Conducting materials; Conductivity; Electromagnetic diffraction; Electromagnetic fields; Electromagnetic scattering; Magnetic materials; Nondestructive testing; Optical scattering; Permittivity; Radar scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Direct and Inverse Problems of Electromagnetic and Acoustic Wave Theory, 2007 XIIth International Seminar/Workshop on
Conference_Location :
Lviv
Print_ISBN :
978-966-02-4237-1
Type :
conf
DOI :
10.1109/DIPED.2007.4373579
Filename :
4373579
Link To Document :
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