Title :
Volumetric Phase Metrology for Optical Data Storage
Author :
Ayres, Mark R. ; McLeod, Robert R.
Author_Institution :
Dept. of Electr. Eng., Colorado Univ., Boulder, CO
Abstract :
Index modulation patterns constituting volumetric optical memories are quantitatively measured with a novel scanning microscope. The instrument uses a PSD to provide phase sensitivity and achieves confocal-like depth selectivity in transmission without a pinhole
Keywords :
optical microscopes; optical storage; position measurement; PSD; confocal-like depth selectivity; optical data storage; phase sensitivity; position sensing detector; scanning microscope; volumetric phase metrology; Holographic optical components; Holography; Memory; Metrology; Nonlinear optics; Optical interferometry; Optical refraction; Optical sensors; Optical variables control; Probes;
Conference_Titel :
Optical Data Storage Topical Meeting, 2006
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-9494-1
DOI :
10.1109/ODS.2006.1632742
