1957244

Conduction and Radiation Losses in Microstrips

Van Heuven, J.H.C.

Philips Research Laboratories, Eindhoven-The Netherlands

2

1973

4-7 Sept. 1973

1

4

Conducting materials; Dielectric loss measurement; Dielectric measurements; Dielectric substrates; Loss measurement; Microstrip; Optical ring resonators; Rough surfaces; Silicon compounds; Surface roughness;

English

ieee

Microwave Conference, 1973. 3rd European

Brussels, Belgium

conf

10.1109/EUMA.1973.331740

4130248