Title :
Fractal and structural entropy calculations on the epitaxially grown fulleren structures with the help of image processing
Author :
Nemcsics, Ákos ; Nagy, Szilvia ; Mojze, I. ; Turmezei, Péter
Author_Institution :
Inst. for Microelectron. & Technol., Budapest Tech, Budapest, Hungary
Abstract :
Molecular beam epitaxially grown fullerene layers are investigated with the help of image processing. The layered structures are studied in morphological respect. The individual layer morphologies are derived from the atomic force microscopy picture of the surface. The pattern morphology of the certain layers is analysed by box counting method. The surface morphology shows fractal behaviour. The pattern of each layer shows different dimension. The actual dimension depends on the actual distance of the layer from the substrate. The change of the dimension is attributed to the change of the binding behaviour. The topology of the surface is also studied using participation ratio and structural entropy calculations.
Keywords :
atomic force microscopy; entropy; fractals; fullerenes; molecular beam epitaxial growth; surface morphology; C; atomic force microscopy; box counting method; fractal calculations; fullerene layers; image processing; molecular beam epitaxy; participation ratio; structural entropy calculations; surface morphology; surface topology; Atomic force microscopy; Atomic layer deposition; Entropy; Fractals; Image processing; Molecular beam epitaxial growth; Pattern analysis; Substrates; Surface morphology; Topology;
Conference_Titel :
Intelligent Systems and Informatics, 2009. SISY '09. 7th International Symposium on
Conference_Location :
Subotica
Print_ISBN :
978-1-4244-5348-1
Electronic_ISBN :
978-1-4244-5349-8
DOI :
10.1109/SISY.2009.5291194
