Title :
Error Rate Improvement of 75 nm Super-RENS Signal in 405nm, 0.85 NA System
Author :
Jaeeheol Bae ; Jooh Kim ; Inoh Hwang ; Hyunki Kim ; Jinkyung Lee ; Hyunsoo Park ; Insik Park ; Tominaga, J.
Author_Institution :
Digital Media R&D Center, Samsung Electron. Co Ltd., Suwon
Abstract :
We report the error rate improvement of super-resolution near field structure (Super-RENS) write-once read-many (WORM) disk at a blue laser optical system. (Laser wavelength 405 nm, numerical aperture 0.85) We used a disk of which carrier level of 75 nm is improved. We controlled the equalization (EQ) characteristics and used the adaptive write strategy and advanced partial-response maximum likelihood (PRML) technique. We obtained bit error rate (BER) of 10-4 level with new signal processing techniques. This result shows high feasibility of super-RENS technology for practical use
Keywords :
error statistics; image resolution; maximum likelihood detection; optical disc storage; write-once storage; adaptive write strategy; bit error rate; blue laser optical system; equalization; numerical aperture; partial-response maximum likelihood; super-RENS signal; super-resolution near field structure; write-once read-many disk; Adaptive control; Apertures; Control systems; Disk recording; Error analysis; Optical recording; Optical signal processing; Programmable control; Research and development; Signal resolution;
Conference_Titel :
Optical Data Storage Topical Meeting, 2006
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-9494-1
DOI :
10.1109/ODS.2006.1632764
