DocumentCode :
1957873
Title :
Simulation-based automatic generation of signomial and posynomial performance models for analog integrated circuit sizing
Author :
Daems, W. ; Gielen, G. ; Sansen, W.
Author_Institution :
Dept. of Electr. Eng., Katholieke Univ., Leuven, Belgium
fYear :
2001
fDate :
4-8 Nov. 2001
Firstpage :
70
Lastpage :
74
Abstract :
This paper presents a method to automatically generate posynomial response surface models for the performance parameters of analog integrated circuits. The posynomial models enable the use of efficient geometric programming techniques for circuit sizing and optimization. To avoid manual derivation of approximate symbolic equations and subsequent casting to posynomial format, techniques from design of experiments and response surface modeling in combination with SPICE simulations are used to generate signomial and posynomial models in an automatic way. Attention is paid to estimating the relative ´goodness-of-fit´ of the generated models. Experimental results allow one to assess both the quality of the generated models as well as the strengths and the limitations of the presented approach.
Keywords :
SPICE; analogue integrated circuits; circuit optimisation; circuit simulation; geometric programming; integrated circuit modelling; symbol manipulation; SPICE simulations; analog integrated circuits; approximate symbolic equations; circuit optimization; circuit sizing; geometric programming techniques; goodness-of-fit; integrated circuit sizing; performance parameters; posynomial format; posynomial performance models; response surface modeling; signomial performance models; simulation-based automatic generation; surface models; Analog circuits; Analog integrated circuits; Circuit simulation; Equations; Integrated circuit modeling; Knowledge acquisition; Manuals; Response surface methodology; SPICE; Solid modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Aided Design, 2001. ICCAD 2001. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
ISSN :
1092-3152
Print_ISBN :
0-7803-7247-6
Type :
conf
DOI :
10.1109/ICCAD.2001.968600
Filename :
968600
Link To Document :
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