1957911

Measurement of the Temperature Coefficient of Permittivity for MIC Substrate Materials

Aitken, J.E. ; Ladbrooke, P.H. ; Potok, M.H.N.

Department of Electrical and Electronic Engineering, Royal Military College of Science, Shrivenham, Swindon, SN6 8LA, England

2

1973

4-7 Sept. 1973

1

4

Dielectric constant; Dielectric measurements; Dielectric substrates; Frequency; Microwave integrated circuits; Permittivity measurement; Resonance; Size measurement; Temperature measurement; Thermal expansion;

English

ieee

Microwave Conference, 1973. 3rd European

Brussels, Belgium

conf

10.1109/EUMA.1973.331784

4130280