DocumentCode :
1957914
Title :
A `Bottom-up´ Redefinition for Mobility and the Effect of Poor Tube-Tube Contact on the Performance of CNT Nanobundle Thin Film Transistors
Author :
Pimparkar, Ninad ; Alam, Muhammad Ashraful
Author_Institution :
Purdue Univ., Lafayette
fYear :
2007
fDate :
18-20 June 2007
Firstpage :
17
Lastpage :
18
Abstract :
In this paper, we show that (a) the randomness of mobility of NB-TFT (muNB) is not intrinsic, but rather signals the breakdown of ´top-down´ definition muNB and a percolation-theory based ´bottom-up´ definition of muNB can consistently interpret the results, and (b) the difference between mut and muNB can be attributed to geometrical parameters of transistor such as tube density, tube length, channel length, etc. and tube-tube contact. Our results not only provide specific guidance to achieve geometry-specific theoretical limits of muNB, but also suggest simple characterization of technology-critical tube-tube contact from a few simple measurements.
Keywords :
carbon nanotubes; carrier mobility; nanoelectronics; nanotube devices; semiconductor device models; thin film transistors; CNT nanobundle thin film transistor performance; NB-TFT design; NB-TFT mobility; bottom-up redefinition; channel length; geometrical parameters; percolation-theory; tube density; tube length; tube-tube contact effect; Computer displays; Computer networks; Conducting materials; Contacts; High performance computing; Intelligent networks; Niobium; Poisson equations; Silicon; Thin film transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference, 2007 65th Annual
Conference_Location :
Notre Dame, IN
ISSN :
1548-3770
Print_ISBN :
978-1-4244-1101-6
Electronic_ISBN :
1548-3770
Type :
conf
DOI :
10.1109/DRC.2007.4373630
Filename :
4373630
Link To Document :
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