DocumentCode :
1957982
Title :
Measurement of Overlay Capacitors at X-Band with Independent Assessment of Thinfilm Conductor Losses
Author :
Butlin, R.S. ; Michie, D.F. ; McPhun, M.K.
Author_Institution :
Department of Engineering, University of Warwick, Coventry, CV4 7AL., England.
Volume :
2
fYear :
1973
fDate :
4-7 Sept. 1973
Firstpage :
1
Lastpage :
4
Keywords :
Capacitors; Conductive films; Conductivity measurement; Conductors; Copper; Electrical resistance measurement; Electrodes; Loss measurement; Microwave measurements; Surface resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 1973. 3rd European
Conference_Location :
Brussels, Belgium
Type :
conf
DOI :
10.1109/EUMA.1973.331788
Filename :
4130284
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1957982
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