DocumentCode
1957982
Title
Measurement of Overlay Capacitors at X-Band with Independent Assessment of Thinfilm Conductor Losses
Author
Butlin, R.S. ; Michie, D.F. ; McPhun, M.K.
Author_Institution
Department of Engineering, University of Warwick, Coventry, CV4 7AL., England.
Volume
2
fYear
1973
fDate
4-7 Sept. 1973
Firstpage
1
Lastpage
4
Keywords
Capacitors; Conductive films; Conductivity measurement; Conductors; Copper; Electrical resistance measurement; Electrodes; Loss measurement; Microwave measurements; Surface resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1973. 3rd European
Conference_Location
Brussels, Belgium
Type
conf
DOI
10.1109/EUMA.1973.331788
Filename
4130284
Link To Document