Title :
Software-assisted cache replacement mechanisms for embedded systems
Author :
Jain, P. ; Devadas, S. ; Engels, D. ; Rudolph, L.
Author_Institution :
Lab. for Comput. Sci., MIT, Cambridge, MA, USA
Abstract :
We address the problem of improving cache predictability and performance in embedded systems through the use of software-assisted replacement mechanisms. These mechanisms require additional software controlled state information that affects the cache replacement decision. Software instructions allow a program to kill a particular cache element, i.e. effectively make the element the least recently used element, or keep that cache element, i.e. the element will never be evicted. We prove basic theorems that provide conditions under which kill and keep instructions can be inserted into program code, such that the resulting performance is guaranteed to be as good as or better than the original program run using the standard LRU policy. We developed a compiler algorithm based on the theoretical results that, given an arbitrary program, determines when to perform software-assisted replacement, i.e., when to insert either a kill or keep instruction. Empirical evidence is provided that shows that performance and predictability (worst-case performance) can be improved for many programs.
Keywords :
cache storage; embedded systems; program compilers; storage management; LRU policy; cache element; cache element keep instructions; cache element kill instructions; cache performance; cache predictability; cache replacement decision; compiler algorithm; embedded systems; program code; software controlled state information; software instructions; software-assisted cache replacement mechanisms; software-assisted replacement; software-assisted replacement mechanisms; worst-case performance; Code standards; Computer science; Embedded software; Embedded system; Hardware; Laboratories; Program processors; Random access memory; Software performance; System-on-a-chip;
Conference_Titel :
Computer Aided Design, 2001. ICCAD 2001. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-7803-7247-6
DOI :
10.1109/ICCAD.2001.968607