DocumentCode
1958009
Title
Ge(111)-fin light-emitting diodes
Author
Tani, Kazuki ; Saito, Shin-ichi ; Oda, Katsuya ; Miura, Makoto ; Mine, Toshiyuki ; Sugawara, Toshiki ; Ido, Tatemi
Author_Institution
Inst. for Photonic-Electron. Convergence Syst. Technol. (PECST), Japan
fYear
2011
fDate
14-16 Sept. 2011
Firstpage
217
Lastpage
219
Abstract
Ge quantum wells perpendicular to a substrate, called Ge fins, have been fabricated by selectively oxidizing Si in SiGe grown epitaxially on an atomically flat Si(111) surface. The three-dimensional structure of the fins is suitable for relaxing the compressive strain induced by the lattice constant mismatch between the Si and Ge. The current voltage characteristics of Ge diodes show low dark currents, confirming the high crystalline quality of the Ge fins. By injecting forward currents into the Ge fins, we found direct recombinations at the Γ valley.
Keywords
Ge-Si alloys; elemental semiconductors; germanium; lattice constants; light emitting diodes; semiconductor growth; semiconductor quantum wells; Ge; Si; compressive strain; high crystalline quality; lattice constant mismatch; light-emitting diodes; quantum wells; three-dimensional structure; Atomic layer deposition; Dark current; Light emitting diodes; Photonic band gap; Scanning electron microscopy; Silicon; Silicon germanium;
fLanguage
English
Publisher
ieee
Conference_Titel
Group IV Photonics (GFP), 2011 8th IEEE International Conference on
Conference_Location
London
ISSN
1949-2081
Print_ISBN
978-1-4244-8338-9
Type
conf
DOI
10.1109/GROUP4.2011.6053768
Filename
6053768
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