DocumentCode :
1958009
Title :
Ge(111)-fin light-emitting diodes
Author :
Tani, Kazuki ; Saito, Shin-ichi ; Oda, Katsuya ; Miura, Makoto ; Mine, Toshiyuki ; Sugawara, Toshiki ; Ido, Tatemi
Author_Institution :
Inst. for Photonic-Electron. Convergence Syst. Technol. (PECST), Japan
fYear :
2011
fDate :
14-16 Sept. 2011
Firstpage :
217
Lastpage :
219
Abstract :
Ge quantum wells perpendicular to a substrate, called Ge fins, have been fabricated by selectively oxidizing Si in SiGe grown epitaxially on an atomically flat Si(111) surface. The three-dimensional structure of the fins is suitable for relaxing the compressive strain induced by the lattice constant mismatch between the Si and Ge. The current voltage characteristics of Ge diodes show low dark currents, confirming the high crystalline quality of the Ge fins. By injecting forward currents into the Ge fins, we found direct recombinations at the Γ valley.
Keywords :
Ge-Si alloys; elemental semiconductors; germanium; lattice constants; light emitting diodes; semiconductor growth; semiconductor quantum wells; Ge; Si; compressive strain; high crystalline quality; lattice constant mismatch; light-emitting diodes; quantum wells; three-dimensional structure; Atomic layer deposition; Dark current; Light emitting diodes; Photonic band gap; Scanning electron microscopy; Silicon; Silicon germanium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Group IV Photonics (GFP), 2011 8th IEEE International Conference on
Conference_Location :
London
ISSN :
1949-2081
Print_ISBN :
978-1-4244-8338-9
Type :
conf
DOI :
10.1109/GROUP4.2011.6053768
Filename :
6053768
Link To Document :
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