DocumentCode
1958018
Title
Design high performance and low power 10T full adder cell using double gate MOSFET at 45nm technology
Author
Shrivastava, A.K. ; Akashe, Shyam
Author_Institution
Dept. of Electron. & Instrum., ITM Univ., Gwalior, India
fYear
2013
fDate
3-4 Aug. 2013
Firstpage
1
Lastpage
5
Abstract
Design of complex arithmetic logic circuits considering leakage current, active power and delay is an important and challenging task in deep submicron circuits. Double gate transistor circuit consider as a promising candidate for low power application domain as well as used in Radio Frequency (RF) devices. In this paper we designed full adder with the help of double gate transistor, the used parameters value has been varied significantly thus improving the performance of full adder. Power Gating is one of the most used circuit techniques to reduce the leakage current in idle circuit. In this paper different parameters are analysed on Power Gating Technique. Power Gating technique achieves 93% reduction of leakage current, active power is reduced by 60% and delay is reduced by 14% as compared with conventional double gate full adder. Simulation results of double gate full adder have been performed on cadence virtuoso with 45nm technology.
Keywords
MOSFET; adders; leakage currents; logic circuits; low-power electronics; active power; cadence virtuoso; complex arithmetic logic circuits; delay; design; double gate MOSFET; double gate transistor circuit; high performance full adder cell; leakage current; low power full adder cell; power gating; size 45 nm; Adders; CMOS integrated circuits; Delays; Leakage currents; Logic gates; MOSFET; Double-gate MOSFETs; Power; Power Gating; full adder; leakage current;
fLanguage
English
Publisher
ieee
Conference_Titel
Control Computing Communication & Materials (ICCCCM), 2013 International Conference on
Conference_Location
Allahabad
Print_ISBN
978-1-4799-1374-9
Type
conf
DOI
10.1109/ICCCCM.2013.6648903
Filename
6648903
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