• DocumentCode
    1958237
  • Title

    Simple formulas for transmission and reflection coefficients of a Lamb wave by multiple defects

  • Author

    Kim, Byungsoo ; Roh, Yongrae

  • Author_Institution
    Sch. of Mech. Eng., Kyungpook Nat. Univ., Daegu, South Korea
  • fYear
    2010
  • fDate
    11-14 Oct. 2010
  • Firstpage
    2207
  • Lastpage
    2210
  • Abstract
    With conventional methods such as the finite element analysis and the mode matching technique, the Lamb wave scattering analysis for multiple defects inevitably needed a very large global matrix that was frequently over affordable calculation resource capacity. In this paper, a new efficient methodology to analyze the scattering of Lamb waves by multiple notches is investigated for rapid inspection of defects in a plate. The scattering phenomenon induced by multiple notches is recursively reorganized as a dual defect problem which is interpreted as being composed of four individual processes. The scattering effects induced by each notch were summarized in so called scattering graphs. Then, the eventual scattering of the Lamb waves by the notch was expressed as simple linear equations determined by the scattering graphs. Based on the analysis, the formulas representing the reflection and transmission coefficients of Lamb waves at rectangular multiple defects in a plate are derived in the steady-state domain. The new formulas enable very rapid and easy evaluation of the amplitudes and phases of the scattered waves for an infinite number of scattering cycles.
  • Keywords
    acoustic wave reflection; acoustic wave scattering; acoustic wave transmission; finite element analysis; surface acoustic waves; Lamb wave reflection; Lamb wave scattering analysis; Lamb wave transmission; finite element analysis; mode matching; rectangular multiple defects; steady-state domain; Acoustics; Equations; Mathematical model; Polymers; Reflection; Scattering; Steady-state; Lamb wave; multiple defects; reflection; simple formula; transmission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium (IUS), 2010 IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1948-5719
  • Print_ISBN
    978-1-4577-0382-9
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2010.5935745
  • Filename
    5935745