• DocumentCode
    1958423
  • Title

    Calculation of phase transformation of vanadium oxide using MD simulation and its validation by experimental values

  • Author

    Di Wang ; Chen, Xiaodong ; Qun Zhang ; Yu Liu ; Liu, Jincheng ; Lijiang Hu

  • Author_Institution
    Chem. Dept. of Sci. Sch., Harbin Inst. of Technol., Harbin
  • fYear
    2009
  • fDate
    5-8 Jan. 2009
  • Firstpage
    593
  • Lastpage
    596
  • Abstract
    In the first part of this work, a combination of a software program (molecular dynamic simulation) and traditional optical equations are employed to calculate the state density and band structures of vanadium oxide (including VO, VO2, V2O3 and V2O5) in the wavelength range of 10600 nm to confirm the presence of phase transformations of vanadium oxide. The calculations show that VO and V2O3 have transited completely from a semiconductor phase to the metallic phase in the temperature range of 278 K to 353 K, the transition of the VO2 state occurred at a temperature of 341 K and V2O5 has not transited in the same temperature range. In the second part of this work, the phase transition characteristic of vanadium oxide thin films was reported using experimental values of hysteresis properties. The influence of the film components on the optical properties (transmittance) was studied.
  • Keywords
    band structure; electrical conductivity transitions; thin films; vanadium compounds; VO2; band structures; hysteresis properties; phase transformation; phase transition; Equations; Holographic optical components; Holography; Hysteresis; Optical films; Optical refraction; Optical variables control; Semiconductor thin films; Temperature distribution; Ultrafast optics; MD simulation; Phase transformations; Quantum mechanical calculation; Transmittance; Vanadium oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems, 2009. NEMS 2009. 4th IEEE International Conference on
  • Conference_Location
    Shenzhen
  • Print_ISBN
    978-1-4244-4629-2
  • Electronic_ISBN
    978-1-4244-4630-8
  • Type

    conf

  • DOI
    10.1109/NEMS.2009.5068650
  • Filename
    5068650