DocumentCode
1958423
Title
Calculation of phase transformation of vanadium oxide using MD simulation and its validation by experimental values
Author
Di Wang ; Chen, Xiaodong ; Qun Zhang ; Yu Liu ; Liu, Jincheng ; Lijiang Hu
Author_Institution
Chem. Dept. of Sci. Sch., Harbin Inst. of Technol., Harbin
fYear
2009
fDate
5-8 Jan. 2009
Firstpage
593
Lastpage
596
Abstract
In the first part of this work, a combination of a software program (molecular dynamic simulation) and traditional optical equations are employed to calculate the state density and band structures of vanadium oxide (including VO, VO2, V2O3 and V2O5) in the wavelength range of 10600 nm to confirm the presence of phase transformations of vanadium oxide. The calculations show that VO and V2O3 have transited completely from a semiconductor phase to the metallic phase in the temperature range of 278 K to 353 K, the transition of the VO2 state occurred at a temperature of 341 K and V2O5 has not transited in the same temperature range. In the second part of this work, the phase transition characteristic of vanadium oxide thin films was reported using experimental values of hysteresis properties. The influence of the film components on the optical properties (transmittance) was studied.
Keywords
band structure; electrical conductivity transitions; thin films; vanadium compounds; VO2; band structures; hysteresis properties; phase transformation; phase transition; Equations; Holographic optical components; Holography; Hysteresis; Optical films; Optical refraction; Optical variables control; Semiconductor thin films; Temperature distribution; Ultrafast optics; MD simulation; Phase transformations; Quantum mechanical calculation; Transmittance; Vanadium oxide;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano/Micro Engineered and Molecular Systems, 2009. NEMS 2009. 4th IEEE International Conference on
Conference_Location
Shenzhen
Print_ISBN
978-1-4244-4629-2
Electronic_ISBN
978-1-4244-4630-8
Type
conf
DOI
10.1109/NEMS.2009.5068650
Filename
5068650
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