DocumentCode :
19588
Title :
Time–Space Constrained Codes for Phase-Change Memories
Author :
Minghai Qin ; Yaakobi, Eitan ; SIEGEL, Peter H.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of California, San Diego, La Jolla, CA, USA
Volume :
59
Issue :
8
fYear :
2013
fDate :
Aug. 2013
Firstpage :
5102
Lastpage :
5114
Abstract :
Phase-change memory (PCM) is a promising nonvolatile solid-state memory technology. A PCM cell stores data by using its amorphous and crystalline states. The cell changes between these two states using high temperature. However, since the cells are sensitive to high temperature, it is important, when programming cells (i.e., changing cell levels), to balance the heat both in time and in space. In this paper, we study the time-space constraint for PCM, which was originally proposed by Jiang and coworkers. A code is called an (α, β, p)- constrained code if for any α consecutive rewrites and for any segment of β contiguous cells, the total rewrite cost of the β cells over those α rewrites is at most p. Here, the cells are binary and the rewrite cost is defined to be the Hamming distance between the current and next memory states. First, we show a general upper bound on the achievable rate of these codes which extends the results of Jiang and coworkers. Then, we generalize their construction for (α ≥ 1, β = 1, p = 1)-constrained codes and show another construction for (α = 1, β ≥ 1, p ≥ 1)-constrained codes. Finally, we show that these two constructions can be used to construct codes for all values of α, β, and p.
Keywords :
Hamming codes; phase change memories; Hamming distance; PCM cell stores data; amorphous states; contiguous cells; crystalline states; phase change memories; solid-state memory technology; time space constrained codes; Decoding; Educational institutions; Encoding; Phase change materials; Symmetric matrices; Upper bound; Vectors; Constrained codes; phase-change memory; write-once memory codes;
fLanguage :
English
Journal_Title :
Information Theory, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9448
Type :
jour
DOI :
10.1109/TIT.2013.2257916
Filename :
6497617
Link To Document :
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